Artec 3D Integrates PolyWorks Inspector to Enhance Metrology

Published on January 26, 2026 | Translated from Spanish
Portable 3D scanner Artec Leo on a table, next to a computer screen showing a CAD model in PolyWorks Inspector with a color deviation map.

Artec 3D Integrates PolyWorks Inspector to Enhance Metrology

The company Artec 3D has announced a direct connection with InnovMetric's metrology suite PolyWorks|Inspector. This integration allows data captured with Artec's portable scanning devices to be transferred directly to the professional analysis environment without intermediaries. 🚀

A Direct Bridge for 3D Data

The integration establishes a seamless channel between capturing and analyzing. Users can send meshes, point clouds, and CAD elements directly to PolyWorks. This eliminates the need for additional tools to convert formats, streamlining the entire inspection process.

Key Advantages of the Direct Link:
  • Export data from scanners like Artec Eva or Leo in a single step.
  • Avoid errors that often occur when handling files multiple times.
  • Reduce the total time from scanning an object to obtaining results.
The goal is for engineers to focus on interpreting data, not solving compatibility issues.

Analyze Dimensions and Detect Differences

Within PolyWorks|Inspector, the software automatically aligns the scanned point cloud with the reference CAD model. It calculates deviations between the physical part and the theoretical design, visualizing the differences with intuitive color maps.

Enabled Analysis Capabilities:
  • Measure critical dimensions and verify complex geometries with precision.
  • Check assembly tolerances to ensure parts fit together.
  • Generate automated reports with graphs and tables to document the process.

Impact on Professional Quality Control

This collaboration expands what can be done with 3D metrology, offering an optimized workflow from capture to final report. Technicians and engineers gain efficiency and precision, crucial elements in manufacturing and engineering environments where every micron counts. 🛠️